Research

In-situ TEM tensile testing of multilayer thin films.

Atomically resolved HAADF STEM image of an asymmetric grain boundary in Ti showing GB phase transitioning due to Fe segregation.

TEM image of a nanoparticle in a metal matrix showing void elongation along the tensile axis and twin planes confined around the nanoparticle.

Burgers circuit drawn around a pure Ti grain boundary to measure the defect content in it.

HRTEM image of the Ti thin film /sapphire substrate interface used to find out the orientation relationship between them.

Atom probe tomography of Fe segregation at Ti grain boundary.

A unique grain map obtained from electron backscatter diffraction scan of the Ti thin film showing one large grain with islands of several smaller grains in it.

Research Focus

My research focuses on understanding materials behavior at the atomic scale using advanced electron microscopy techniques. I specialize in aberration-corrected STEM, in-situ TEM testing, and multidimensional characterization to connect structure and properties across different length scales.

Currently at EMPA, I investigate deformation mechanics of metals and multilayer thin films using in-situ tensile testing, while developing new methodologies for real-time observation of nanoscale phenomena.

Advanced Electron Microscopy

Aberration-corrected STEM imaging, analytical techniques, and STEM simulations for atomic-scale material characterization.

In-situ TEM Testing

Real-time observation of deformation mechanisms in metals and multilayer thin films using specialized TEM holders.

Grain Boundary Engineering

Understanding grain boundary structure, segregation phenomena, and their impact on material properties.

Multiscale Characterization

Connecting atomic structure and composition to macroscopic properties through comprehensive material analysis.